A critical-point yield model to appraise the damage caused to soybean by white-mold

Authors

  • Erlei M. Reis Instituto AGRIS
  • Mateus Zanatta Instituto AGRIS
  • Fernando Cezar Juliatti Universidade Federal de Uberlândia
  • Hercules D. Campos Universidade de Rio Verde
  • Luis Henrique Carregal P. Silva Universidade de Rio Verde
  • Maurício C. Meyer Embrapa Soja/CTPA/Emater
  • José Nunes Junior Embrapa Soja/CTPA/Emater
  • Cláudia B. Pimenta Universidade Federal de Mato Grosso
  • Daniel Cassetari Neto Universidade Federal de Mato Grosso
  • Andréia Q. Machado Tagro
  • Carlos M. Utiamada Tagro

DOI:

https://doi.org/10.14393/BJ-v36n6a2020-55438

Keywords:

Glycine max., Sclerotinia sclerotiorum, Sclerotinia stem rot.

Abstract

A model to estimate the damage caused by white mold to soybean yield from experimental field data gathered during the summer season of 2009-10 was generated. Six soybean cultivars were grown on six sites of the Cerrados region, resulting in a total of nine separate experiments. The gradient of disease intensity (plant stem incidence) and yield was generated through the application of different fungicides and rates three times over the course of the season. The disease incidence in plant stems was evaluated at the R1, R5.2 and R5.5 growing stages. Manual harvest at the physiological ripening stage was followed by grain drying, threshing, and cleaning. Finally, grain yield was estimated in kg/ha, and regression analysis was performed. Nine linear equations representing the damage function were generated. The mean damage function was y = - 6.7 x + 1,000, where y represents grain yield normalized to 1,000 kg/ha and x represents WM incidence in plants. To appraise the damage caused by various disease intensities, these models should first be validated. Damage coefficients may be used to determine the level of economic damage.

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Published

2020-08-27

How to Cite

REIS, E.M.., ZANATTA, M.., JULIATTI, F.C.., CAMPOS, H.D.., SILVA, L.H.C.P.., MEYER, M.C.., NUNES JUNIOR, J.., PIMENTA, C.B.., CASSETARI NETO, D.., MACHADO, A.Q.. and UTIAMADA, C.M.., 2020. A critical-point yield model to appraise the damage caused to soybean by white-mold. Bioscience Journal [online], vol. 36, no. 6, pp. 1816–1820. [Accessed20 May 2022]. DOI 10.14393/BJ-v36n6a2020-55438. Available from: https://seer.ufu.br/index.php/biosciencejournal/article/view/55438.

Issue

Section

Agricultural Sciences