Reis EM, Zanatta M, Juliatti FC, Campos HD, Silva LHCP, Meyer MC, Nunes Junior J, Pimenta CB, Cassetari Neto D, Machado AQ, Utiamada CM. A critical-point yield model to appraise the damage caused to soybean by white-mold. Biosci. J. [Internet]. 2020 Aug. 27 [cited 2024 Nov. 23];36(6):1816-20. Available from: https://seer.ufu.br/index.php/biosciencejournal/article/view/55438